Dr. Ethan R. Malik. “Resilient Processor Architectures and Hybrid Error-Detection Strategies for Mitigating Radiation-Induced Soft Errors in Modern Embedded Systems”. European International Journal of Multidisciplinary Research and Management Studies 3, no. 12 (December 29, 2023): 212–217. Accessed December 27, 2025. https://www.eipublication.com/index.php/eijmrms/article/view/3574.